Abnormal temperature dependence of exchange bias in the NiFe5/Ta0.2/IrMn8 system
10.1063/1.1555333
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Main Authors: | Li, K., Guo, Z., Han, G., Qiu, J., Wu, Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/69135 |
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Institution: | National University of Singapore |
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