Analysis of the drain thermal noise for deep submicron MOSFETs

10.1109/APMC.2009.5384327

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Bibliographic Details
Main Authors:	Ji, Y., Nan, L., Mouthaan, K.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69407
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-69407
record_format	dspace
spelling	sg-nus-scholar.10635-694072015-01-29T01:24:13Z Analysis of the drain thermal noise for deep submicron MOSFETs Ji, Y. Nan, L. Mouthaan, K. ELECTRICAL & COMPUTER ENGINEERING 10.1109/APMC.2009.5384327 APMC 2009 - Asia Pacific Microwave Conference 2009 1659-1662 2014-06-19T03:00:19Z 2014-06-19T03:00:19Z 2009 Conference Paper Ji, Y.,Nan, L.,Mouthaan, K. (2009). Analysis of the drain thermal noise for deep submicron MOSFETs. APMC 2009 - Asia Pacific Microwave Conference 2009 : 1659-1662. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/APMC.2009.5384327" target="_blank">https://doi.org/10.1109/APMC.2009.5384327</a> 9781424428021 http://scholarbank.nus.edu.sg/handle/10635/69407 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	10.1109/APMC.2009.5384327
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Ji, Y. Nan, L. Mouthaan, K.
format	Conference or Workshop Item
author	Ji, Y. Nan, L. Mouthaan, K.
spellingShingle	Ji, Y. Nan, L. Mouthaan, K. Analysis of the drain thermal noise for deep submicron MOSFETs
author_sort	Ji, Y.
title	Analysis of the drain thermal noise for deep submicron MOSFETs
title_short	Analysis of the drain thermal noise for deep submicron MOSFETs
title_full	Analysis of the drain thermal noise for deep submicron MOSFETs
title_fullStr	Analysis of the drain thermal noise for deep submicron MOSFETs
title_full_unstemmed	Analysis of the drain thermal noise for deep submicron MOSFETs
title_sort	analysis of the drain thermal noise for deep submicron mosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/69407
_version_	1681087008194166784

Analysis of the drain thermal noise for deep submicron MOSFETs

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