Analysis of the drain thermal noise for deep submicron MOSFETs

10.1109/APMC.2009.5384327

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Bibliographic Details
Main Authors: Ji, Y., Nan, L., Mouthaan, K.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69407
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Institution: National University of Singapore