Characterization and modeling of avalanche multiplication in HBTs

10.1016/S0026-2692(01)00102-1

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Bibliographic Details
Main Authors:	Lin, F., Chen, B., Zhou, T., Ooi, B.L., Kooi, P.S.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Avalanche multiplication Bipolar transistor modeling Compact model Parameter extraction SiGe HBT VBIC
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69582
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Institution:	National University of Singapore

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