Dynamic NBTI of PMOS transistors and its impact on device lifetime
Annual Proceedings - Reliability Physics (Symposium)
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2014
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sg-nus-scholar.10635-700452015-03-06T19:18:54Z Dynamic NBTI of PMOS transistors and its impact on device lifetime Chen, G. Chuah, K.Y. Li, M.F. Chan, D.S.H. Ang, C.H. Zheng, J.Z. Jin, Y. Kwong, D.L. ELECTRICAL & COMPUTER ENGINEERING ELECTRICAL ENGINEERING Annual Proceedings - Reliability Physics (Symposium) 196-202 ARLPB 2014-06-19T03:07:36Z 2014-06-19T03:07:36Z 2003 Conference Paper Chen, G.,Chuah, K.Y.,Li, M.F.,Chan, D.S.H.,Ang, C.H.,Zheng, J.Z.,Jin, Y.,Kwong, D.L. (2003). Dynamic NBTI of PMOS transistors and its impact on device lifetime. Annual Proceedings - Reliability Physics (Symposium) : 196-202. ScholarBank@NUS Repository. 00999512 http://scholarbank.nus.edu.sg/handle/10635/70045 NOT_IN_WOS Scopus |
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Annual Proceedings - Reliability Physics (Symposium) |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Chen, G. Chuah, K.Y. Li, M.F. Chan, D.S.H. Ang, C.H. Zheng, J.Z. Jin, Y. Kwong, D.L. |
format |
Conference or Workshop Item |
author |
Chen, G. Chuah, K.Y. Li, M.F. Chan, D.S.H. Ang, C.H. Zheng, J.Z. Jin, Y. Kwong, D.L. |
spellingShingle |
Chen, G. Chuah, K.Y. Li, M.F. Chan, D.S.H. Ang, C.H. Zheng, J.Z. Jin, Y. Kwong, D.L. Dynamic NBTI of PMOS transistors and its impact on device lifetime |
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Chen, G. |
title |
Dynamic NBTI of PMOS transistors and its impact on device lifetime |
title_short |
Dynamic NBTI of PMOS transistors and its impact on device lifetime |
title_full |
Dynamic NBTI of PMOS transistors and its impact on device lifetime |
title_fullStr |
Dynamic NBTI of PMOS transistors and its impact on device lifetime |
title_full_unstemmed |
Dynamic NBTI of PMOS transistors and its impact on device lifetime |
title_sort |
dynamic nbti of pmos transistors and its impact on device lifetime |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/70045 |
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1681087126466199552 |