Ge MOS transistor technology and reliability
10.1109/ICSICT.2006.306095
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2014
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sg-nus-scholar.10635-704102024-11-10T18:35:44Z Ge MOS transistor technology and reliability Zhu, C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/ICSICT.2006.306095 ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings 128-131 2014-06-19T03:11:50Z 2014-06-19T03:11:50Z 2007 Conference Paper Zhu, C. (2007). Ge MOS transistor technology and reliability. ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings : 128-131. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/ICSICT.2006.306095" target="_blank">https://doi.org/10.1109/ICSICT.2006.306095</a> 1424401615 http://scholarbank.nus.edu.sg/handle/10635/70410 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
| content_provider |
NUS Library |
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ScholarBank@NUS |
| description |
10.1109/ICSICT.2006.306095 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Zhu, C. |
| format |
Conference or Workshop Item |
| author |
Zhu, C. |
| spellingShingle |
Zhu, C. Ge MOS transistor technology and reliability |
| author_sort |
Zhu, C. |
| title |
Ge MOS transistor technology and reliability |
| title_short |
Ge MOS transistor technology and reliability |
| title_full |
Ge MOS transistor technology and reliability |
| title_fullStr |
Ge MOS transistor technology and reliability |
| title_full_unstemmed |
Ge MOS transistor technology and reliability |
| title_sort |
ge mos transistor technology and reliability |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/70410 |
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1821188109326352384 |