Integrated metrology and processes for semiconductor manufacturing

10.1109/IECON.2005.1569258

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Bibliographic Details
Main Authors: Ho, W.K., Tay, A., Lim, K.W., Loh, A.P., Tan, W.W.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/70621
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-706212015-03-06T12:45:13Z Integrated metrology and processes for semiconductor manufacturing Ho, W.K. Tay, A. Lim, K.W. Loh, A.P. Tan, W.W. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IECON.2005.1569258 IECON Proceedings (Industrial Electronics Conference) 2005 2278-2281 IEPRE 2014-06-19T03:14:15Z 2014-06-19T03:14:15Z 2005 Conference Paper Ho, W.K.,Tay, A.,Lim, K.W.,Loh, A.P.,Tan, W.W. (2005). Integrated metrology and processes for semiconductor manufacturing. IECON Proceedings (Industrial Electronics Conference) 2005 : 2278-2281. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IECON.2005.1569258" target="_blank">https://doi.org/10.1109/IECON.2005.1569258</a> 0780392523 http://scholarbank.nus.edu.sg/handle/10635/70621 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description 10.1109/IECON.2005.1569258
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Ho, W.K.
Tay, A.
Lim, K.W.
Loh, A.P.
Tan, W.W.
format Conference or Workshop Item
author Ho, W.K.
Tay, A.
Lim, K.W.
Loh, A.P.
Tan, W.W.
spellingShingle Ho, W.K.
Tay, A.
Lim, K.W.
Loh, A.P.
Tan, W.W.
Integrated metrology and processes for semiconductor manufacturing
author_sort Ho, W.K.
title Integrated metrology and processes for semiconductor manufacturing
title_short Integrated metrology and processes for semiconductor manufacturing
title_full Integrated metrology and processes for semiconductor manufacturing
title_fullStr Integrated metrology and processes for semiconductor manufacturing
title_full_unstemmed Integrated metrology and processes for semiconductor manufacturing
title_sort integrated metrology and processes for semiconductor manufacturing
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/70621
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