Novel acoustic techniques for microelectronic failure analysis and characterization
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
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2014
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sg-nus-scholar.10635-711702015-01-06T06:01:50Z Novel acoustic techniques for microelectronic failure analysis and characterization Wong, W.K. Street, A.G. ELECTRICAL & COMPUTER ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 14-19 2014-06-19T03:20:41Z 2014-06-19T03:20:41Z 2005 Conference Paper Wong, W.K.,Street, A.G. (2005). Novel acoustic techniques for microelectronic failure analysis and characterization. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 14-19. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/71170 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
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NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Wong, W.K. Street, A.G. |
| format |
Conference or Workshop Item |
| author |
Wong, W.K. Street, A.G. |
| spellingShingle |
Wong, W.K. Street, A.G. Novel acoustic techniques for microelectronic failure analysis and characterization |
| author_sort |
Wong, W.K. |
| title |
Novel acoustic techniques for microelectronic failure analysis and characterization |
| title_short |
Novel acoustic techniques for microelectronic failure analysis and characterization |
| title_full |
Novel acoustic techniques for microelectronic failure analysis and characterization |
| title_fullStr |
Novel acoustic techniques for microelectronic failure analysis and characterization |
| title_full_unstemmed |
Novel acoustic techniques for microelectronic failure analysis and characterization |
| title_sort |
novel acoustic techniques for microelectronic failure analysis and characterization |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/71170 |
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1681087334802522112 |