Novel acoustic techniques for microelectronic failure analysis and characterization

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Saved in:
Bibliographic Details
Main Authors: Wong, W.K., Street, A.G.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71170
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first