Transmission characteristics of a coaxial through-silicon via (C-TSV) interconnect

10.1109/ISEMC.2011.6038339

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Bibliographic Details
Main Authors: Zhao, W.-S., Guo, Y.-X., Yin, W.-Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72075
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Institution: National University of Singapore