On the upper truncated Weibull distribution and its reliability implications

10.1016/j.ress.2010.09.004

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Bibliographic Details
Main Authors: Zhang, T., Xie, M.
Other Authors: INDUSTRIAL & SYSTEMS ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72360
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Institution: National University of Singapore

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