On the upper truncated Weibull distribution and its reliability implications
10.1016/j.ress.2010.09.004
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Main Authors: | Zhang, T., Xie, M. |
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Other Authors: | INDUSTRIAL & SYSTEMS ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72360 |
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Institution: | National University of Singapore |
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