Automatic IC Die Positioning in the SEM

Conference Proceedings from the International Symposium for Testing and Failure Analysis

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Bibliographic Details
Main Authors:	Tan, H.W., Phang, J.C.H., Thong, J.T.L.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/72500
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-72500
record_format	dspace
spelling	sg-nus-scholar.10635-725002015-02-16T02:59:23Z Automatic IC Die Positioning in the SEM Tan, H.W. Phang, J.C.H. Thong, J.T.L. ELECTRICAL ENGINEERING Conference Proceedings from the International Symposium for Testing and Failure Analysis 469-477 2014-06-19T05:08:45Z 2014-06-19T05:08:45Z 2000 Conference Paper Tan, H.W.,Phang, J.C.H.,Thong, J.T.L. (2000). Automatic IC Die Positioning in the SEM. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 469-477. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72500 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Conference Proceedings from the International Symposium for Testing and Failure Analysis
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Tan, H.W. Phang, J.C.H. Thong, J.T.L.
format	Conference or Workshop Item
author	Tan, H.W. Phang, J.C.H. Thong, J.T.L.
spellingShingle	Tan, H.W. Phang, J.C.H. Thong, J.T.L. Automatic IC Die Positioning in the SEM
author_sort	Tan, H.W.
title	Automatic IC Die Positioning in the SEM
title_short	Automatic IC Die Positioning in the SEM
title_full	Automatic IC Die Positioning in the SEM
title_fullStr	Automatic IC Die Positioning in the SEM
title_full_unstemmed	Automatic IC Die Positioning in the SEM
title_sort	automatic ic die positioning in the sem
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/72500
_version_	1681087577163038720

Automatic IC Die Positioning in the SEM

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