Charge trapping as the dominant degradation mechanism during plasma processing of 0.25 μm technology devices

International Symposium on IC Technology, Systems and Applications

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Bibliographic Details
Main Authors: Song, J., Chim, W.K., Chan, D.S.H., Pan, Y.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72518
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Institution: National University of Singapore
Description
Summary:International Symposium on IC Technology, Systems and Applications