Integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing

IECON Proceedings (Industrial Electronics Conference)

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Main Authors: Lim, K.W., Luo, J., Gu, J., Poh, Y.P., Tan, W.W., Loh, A.P.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72708
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-727082015-01-28T12:36:04Z Integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing Lim, K.W. Luo, J. Gu, J. Poh, Y.P. Tan, W.W. Loh, A.P. ELECTRICAL ENGINEERING IECON Proceedings (Industrial Electronics Conference) 1 6-10 IEPRE 2014-06-19T05:11:06Z 2014-06-19T05:11:06Z 1999 Conference Paper Lim, K.W.,Luo, J.,Gu, J.,Poh, Y.P.,Tan, W.W.,Loh, A.P. (1999). Integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing. IECON Proceedings (Industrial Electronics Conference) 1 : 6-10. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72708 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description IECON Proceedings (Industrial Electronics Conference)
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Lim, K.W.
Luo, J.
Gu, J.
Poh, Y.P.
Tan, W.W.
Loh, A.P.
format Conference or Workshop Item
author Lim, K.W.
Luo, J.
Gu, J.
Poh, Y.P.
Tan, W.W.
Loh, A.P.
spellingShingle Lim, K.W.
Luo, J.
Gu, J.
Poh, Y.P.
Tan, W.W.
Loh, A.P.
Integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing
author_sort Lim, K.W.
title Integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing
title_short Integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing
title_full Integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing
title_fullStr Integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing
title_full_unstemmed Integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing
title_sort integrated in-line temperature measurement system for silicon wafer semiconductor manufacturing
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/72708
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