Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation
Conference Proceedings from the International Symposium for Testing and Failure Analysis
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2014
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sg-nus-scholar.10635-729022015-02-12T02:10:32Z Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation Wong, W.K. Yin, Q.R. Thong, J.T.L. Phang, J.C.H. Fang, J.W. ELECTRICAL ENGINEERING Conference Proceedings from the International Symposium for Testing and Failure Analysis 11-16 2014-06-19T05:13:18Z 2014-06-19T05:13:18Z 2000 Conference Paper Wong, W.K.,Yin, Q.R.,Thong, J.T.L.,Phang, J.C.H.,Fang, J.W. (2000). Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation. Conference Proceedings from the International Symposium for Testing and Failure Analysis : 11-16. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72902 NOT_IN_WOS Scopus |
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National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Conference Proceedings from the International Symposium for Testing and Failure Analysis |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Wong, W.K. Yin, Q.R. Thong, J.T.L. Phang, J.C.H. Fang, J.W. |
| format |
Conference or Workshop Item |
| author |
Wong, W.K. Yin, Q.R. Thong, J.T.L. Phang, J.C.H. Fang, J.W. |
| spellingShingle |
Wong, W.K. Yin, Q.R. Thong, J.T.L. Phang, J.C.H. Fang, J.W. Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation |
| author_sort |
Wong, W.K. |
| title |
Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation |
| title_short |
Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation |
| title_full |
Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation |
| title_fullStr |
Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation |
| title_full_unstemmed |
Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation |
| title_sort |
scanning electron acoustic microscopy: a novel tool for failure analysis & microcharacterisation |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72902 |
| _version_ |
1681087650177482752 |