Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis & Microcharacterisation
Conference Proceedings from the International Symposium for Testing and Failure Analysis
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Main Authors: | Wong, W.K., Yin, Q.R., Thong, J.T.L., Phang, J.C.H., Fang, J.W. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72902 |
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Institution: | National University of Singapore |
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