Study of integrated circuits I-V characteristics using a fault localization systems [FLS]

Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA

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Bibliographic Details
Main Authors:	Quah, L.T.S., Wong, W.K., Phang, J.C.H., Chan, D.S.H., Ho, P.Y.S.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/72947
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-72947
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spelling	sg-nus-scholar.10635-729472015-04-06T02:39:11Z Study of integrated circuits I-V characteristics using a fault localization systems [FLS] Quah, L.T.S. Wong, W.K. Phang, J.C.H. Chan, D.S.H. Ho, P.Y.S. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA 75-80 00234 2014-06-19T05:13:48Z 2014-06-19T05:13:48Z 1995 Conference Paper Quah, L.T.S.,Wong, W.K.,Phang, J.C.H.,Chan, D.S.H.,Ho, P.Y.S. (1995). Study of integrated circuits I-V characteristics using a fault localization systems [FLS]. Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA : 75-80. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72947 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Quah, L.T.S. Wong, W.K. Phang, J.C.H. Chan, D.S.H. Ho, P.Y.S.
format	Conference or Workshop Item
author	Quah, L.T.S. Wong, W.K. Phang, J.C.H. Chan, D.S.H. Ho, P.Y.S.
spellingShingle	Quah, L.T.S. Wong, W.K. Phang, J.C.H. Chan, D.S.H. Ho, P.Y.S. Study of integrated circuits I-V characteristics using a fault localization systems [FLS]
author_sort	Quah, L.T.S.
title	Study of integrated circuits I-V characteristics using a fault localization systems [FLS]
title_short	Study of integrated circuits I-V characteristics using a fault localization systems [FLS]
title_full	Study of integrated circuits I-V characteristics using a fault localization systems [FLS]
title_fullStr	Study of integrated circuits I-V characteristics using a fault localization systems [FLS]
title_full_unstemmed	Study of integrated circuits I-V characteristics using a fault localization systems [FLS]
title_sort	study of integrated circuits i-v characteristics using a fault localization systems [fls]
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/72947
_version_	1681087658383638528

Study of integrated circuits I-V characteristics using a fault localization systems [FLS]

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