Automatic identification and removal of artifacts in EEG using a probabilistic multi-class SVM approach with error correction

Automatic identification and removal of artifacts in EEG using a probabilistic multi-class SVM approach with error correction

10.1109/ICSMC.2008.4811434

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Bibliographic Details
Main Authors: Shao, S.-Y., Shen, K.-Q., Ong, C.-J., Li, X.-P., Wilder-Smith, E.P.V.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Artifact removal
Electroencephalogram
Error correction
Support vector machine
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73208
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Institution: National University of Singapore

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