Automatic identification and removal of artifacts in EEG using a probabilistic multi-class SVM approach with error correction

• Main Authors: Shao, S.-Y., Shen, K.-Q., Ong, C.-J., Li, X.-P., Wilder-Smith, E.P.V.
• Other Authors: MECHANICAL ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Artifact removal; Electroencephalogram; Error correction; Support vector machine
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/73208
• Institution: National University of Singapore

10.1109/ICSMC.2008.4811434