Measurement of MMIC gate temperature using infrared and Thermoreflectance thermography

Measurement of MMIC gate temperature using infrared and Thermoreflectance thermography

10.1109/EPTC.2012.6507136

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Bibliographic Details
Main Authors: Ling, J.H.L., Tay, A.A.O., Choo, K.F., Chen, W., Kendig, D.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73590
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/73590

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