Measurement of MMIC gate temperature using infrared and Thermoreflectance thermography
10.1109/EPTC.2012.6507136
Saved in:
Main Authors: | Ling, J.H.L., Tay, A.A.O., Choo, K.F., Chen, W., Kendig, D. |
---|---|
Other Authors: | MECHANICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/73590 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Accurate thermal characterization of a GaN PA MMIC using Thermoreflectance thermography
by: Ling, J.H.L., et al.
Published: (2014) -
STUDY OF MATERIALS BY ENHANCED THERMOREFLECTANCE THERMOGRAPHY
by: TAN SOO HWEE JASLYN
Published: (2020) -
Thermal characterization and modelling of a gallium arsenide power amplifier MMIC
by: Ling, J.H.L., et al.
Published: (2014) -
Infrared thermography on ocular surface temperature: A review
by: Tan, J.-H., et al.
Published: (2016) -
Development of computer methods in the investigations of ocular surface temperature by infrared thermography
by: Tan, Jen Hong
Published: (2011)