Residual stress and profile evaluation on an optical MEMS device

Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009

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Bibliographic Details
Main Authors: Tay, C.J., Quan, C., Akkipeddi, R., Gopal, M.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73814
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-738142015-03-07T18:58:41Z Residual stress and profile evaluation on an optical MEMS device Tay, C.J. Quan, C. Akkipeddi, R. Gopal, M. MECHANICAL ENGINEERING Fabry-Perot filter Raman spectroscopy Residual stresses White light interferometry Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009 2 786-791 2014-06-19T05:39:39Z 2014-06-19T05:39:39Z 2009 Conference Paper Tay, C.J.,Quan, C.,Akkipeddi, R.,Gopal, M. (2009). Residual stress and profile evaluation on an optical MEMS device. Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009 2 : 786-791. ScholarBank@NUS Repository. 9781615671892 http://scholarbank.nus.edu.sg/handle/10635/73814 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
topic Fabry-Perot filter
Raman spectroscopy
Residual stresses
White light interferometry
spellingShingle Fabry-Perot filter
Raman spectroscopy
Residual stresses
White light interferometry
Tay, C.J.
Quan, C.
Akkipeddi, R.
Gopal, M.
Residual stress and profile evaluation on an optical MEMS device
description Society for Experimental Mechanics - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2009
author2 MECHANICAL ENGINEERING
author_facet MECHANICAL ENGINEERING
Tay, C.J.
Quan, C.
Akkipeddi, R.
Gopal, M.
format Conference or Workshop Item
author Tay, C.J.
Quan, C.
Akkipeddi, R.
Gopal, M.
author_sort Tay, C.J.
title Residual stress and profile evaluation on an optical MEMS device
title_short Residual stress and profile evaluation on an optical MEMS device
title_full Residual stress and profile evaluation on an optical MEMS device
title_fullStr Residual stress and profile evaluation on an optical MEMS device
title_full_unstemmed Residual stress and profile evaluation on an optical MEMS device
title_sort residual stress and profile evaluation on an optical mems device
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/73814
_version_ 1681087816170209280