Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam

10.1016/j.proeng.2011.04.362

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Bibliographic Details
Main Authors: Song, X., Yeap, K.B., Zhu, J., Belnoue, J., Sebastiani, M., Bemporad, E., Zeng, K.Y., Korsunsky, A.M.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
DIC
FIB
SEM
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73815
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Institution: National University of Singapore