The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction
10.1016/S0039-6028(00)01064-5
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sg-nus-scholar.10635-772372023-10-30T21:13:08Z The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction Xie, X.N. Wang, H.Q. Wee, A.T.S. Loh, K.P. CHEMISTRY PHYSICS Auger electron spectroscopy Graphite Low energy electron diffraction (LEED) Reflection high-energy electron diffraction (RHEED) Semiconducting surfaces Silicon carbide Surface relaxation and reconstruction Surface structure, morphology, roughness, and topography 10.1016/S0039-6028(00)01064-5 Surface Science 478 1-2 57-71 SUSCA 2014-06-23T05:52:33Z 2014-06-23T05:52:33Z 2001-05-01 Article Xie, X.N., Wang, H.Q., Wee, A.T.S., Loh, K.P. (2001-05-01). The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction. Surface Science 478 (1-2) : 57-71. ScholarBank@NUS Repository. https://doi.org/10.1016/S0039-6028(00)01064-5 00396028 http://scholarbank.nus.edu.sg/handle/10635/77237 000168314600015 Scopus |
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Auger electron spectroscopy Graphite Low energy electron diffraction (LEED) Reflection high-energy electron diffraction (RHEED) Semiconducting surfaces Silicon carbide Surface relaxation and reconstruction Surface structure, morphology, roughness, and topography |
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Auger electron spectroscopy Graphite Low energy electron diffraction (LEED) Reflection high-energy electron diffraction (RHEED) Semiconducting surfaces Silicon carbide Surface relaxation and reconstruction Surface structure, morphology, roughness, and topography Xie, X.N. Wang, H.Q. Wee, A.T.S. Loh, K.P. The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction |
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10.1016/S0039-6028(00)01064-5 |
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CHEMISTRY |
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CHEMISTRY Xie, X.N. Wang, H.Q. Wee, A.T.S. Loh, K.P. |
format |
Article |
author |
Xie, X.N. Wang, H.Q. Wee, A.T.S. Loh, K.P. |
author_sort |
Xie, X.N. |
title |
The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction |
title_short |
The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction |
title_full |
The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction |
title_fullStr |
The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction |
title_full_unstemmed |
The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction |
title_sort |
evolution of 3 × 3, 6 × 6, √3 × √3r30° and 6√3 × 6√3r30° superstructures on 6h-sic (0 0 0 1) surfaces studied by reflection high energy electron diffraction |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/77237 |
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1781783740706455552 |