The evolution of 3 × 3, 6 × 6, √3 × √3R30° and 6√3 × 6√3R30° superstructures on 6H-SiC (0 0 0 1) surfaces studied by reflection high energy electron diffraction

• Main Authors: Xie, X.N., Wang, H.Q., Wee, A.T.S., Loh, K.P.
• 其他作者: PHYSICS
• 格式: Article
• 出版: 2014
• 主題: Auger electron spectroscopy; Graphite; Low energy electron diffraction (LEED); Reflection high-energy electron diffraction (RHEED); Semiconducting surfaces; Silicon carbide; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/77237

10.1016/S0039-6028(00)01064-5