A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope

10.1088/0957-0233/6/5/009

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Bibliographic Details
Main Author:	Chim, W.K.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80280
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-802802023-10-27T07:14:53Z A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope Chim, W.K. ELECTRICAL ENGINEERING 10.1088/0957-0233/6/5/009 Measurement Science and Technology 6 5 488-495 2014-10-07T02:55:47Z 2014-10-07T02:55:47Z 1995 Article Chim, W.K. (1995). A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope. Measurement Science and Technology 6 (5) : 488-495. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/6/5/009 09570233 http://scholarbank.nus.edu.sg/handle/10635/80280 A1995QZ48500009 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1088/0957-0233/6/5/009
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Chim, W.K.
format	Article
author	Chim, W.K.
spellingShingle	Chim, W.K. A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope
author_sort	Chim, W.K.
title	A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope
title_short	A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope
title_full	A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope
title_fullStr	A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope
title_full_unstemmed	A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope
title_sort	novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/80280
_version_	1781783895895703552

A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope

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