A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope
10.1088/0957-0233/6/5/009
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Main Author: | Chim, W.K. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80280 |
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Institution: | National University of Singapore |
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