Depth profiling of GaN by cathodoluminescence microanalysis
10.1063/1.123460
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sg-nus-scholar.10635-803502024-11-14T02:29:09Z Depth profiling of GaN by cathodoluminescence microanalysis Fleischer, K. Toth, M. Phillips, M.R. Zou, J. Li, G. Chua, S.J. ELECTRICAL ENGINEERING 10.1063/1.123460 Applied Physics Letters 74 8 1114-1116 APPLA 2014-10-07T02:56:34Z 2014-10-07T02:56:34Z 1999 Article Fleischer, K., Toth, M., Phillips, M.R., Zou, J., Li, G., Chua, S.J. (1999). Depth profiling of GaN by cathodoluminescence microanalysis. Applied Physics Letters 74 (8) : 1114-1116. ScholarBank@NUS Repository. https://doi.org/10.1063/1.123460 00036951 http://scholarbank.nus.edu.sg/handle/10635/80350 000078685700020 Scopus |
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National University of Singapore |
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NUS Library |
| continent |
Asia |
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Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1063/1.123460 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Fleischer, K. Toth, M. Phillips, M.R. Zou, J. Li, G. Chua, S.J. |
| format |
Article |
| author |
Fleischer, K. Toth, M. Phillips, M.R. Zou, J. Li, G. Chua, S.J. |
| spellingShingle |
Fleischer, K. Toth, M. Phillips, M.R. Zou, J. Li, G. Chua, S.J. Depth profiling of GaN by cathodoluminescence microanalysis |
| author_sort |
Fleischer, K. |
| title |
Depth profiling of GaN by cathodoluminescence microanalysis |
| title_short |
Depth profiling of GaN by cathodoluminescence microanalysis |
| title_full |
Depth profiling of GaN by cathodoluminescence microanalysis |
| title_fullStr |
Depth profiling of GaN by cathodoluminescence microanalysis |
| title_full_unstemmed |
Depth profiling of GaN by cathodoluminescence microanalysis |
| title_sort |
depth profiling of gan by cathodoluminescence microanalysis |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80350 |
| _version_ |
1821224223299862528 |