Depth profiling of GaN by cathodoluminescence microanalysis

Depth profiling of GaN by cathodoluminescence microanalysis

10.1063/1.123460

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Bibliographic Details
Main Authors:	Fleischer, K., Toth, M., Phillips, M.R., Zou, J., Li, G., Chua, S.J.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80350
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Institution:	National University of Singapore

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