Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's

Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's

10.1109/16.398669

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Main Authors: Ling, C.H., Ang, D.S., Tan, S.E.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80376
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-803762023-10-26T21:25:20Z Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's Ling, C.H. Ang, D.S. Tan, S.E. ELECTRICAL ENGINEERING 10.1109/16.398669 IEEE Transactions on Electron Devices 42 8 1528-1535 IETDA 2014-10-07T02:56:51Z 2014-10-07T02:56:51Z 1995-08 Article Ling, C.H., Ang, D.S., Tan, S.E. (1995-08). Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's. IEEE Transactions on Electron Devices 42 (8) : 1528-1535. ScholarBank@NUS Repository. https://doi.org/10.1109/16.398669 00189383 http://scholarbank.nus.edu.sg/handle/10635/80376 A1995RJ15000018 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/16.398669
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Ling, C.H.
Ang, D.S.
Tan, S.E.
format Article
author Ling, C.H.
Ang, D.S.
Tan, S.E.
spellingShingle Ling, C.H.
Ang, D.S.
Tan, S.E.
Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's
author_sort Ling, C.H.
title Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's
title_short Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's
title_full Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's
title_fullStr Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's
title_full_unstemmed Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's
title_sort effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed mosfet's
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/80376
_version_ 1781783902773313536

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