Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate

Microelectronics Reliability

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Main Authors:	Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80546
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-80546
record_format	dspace
spelling	sg-nus-scholar.10635-805462015-02-06T11:25:32Z Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. ELECTRICAL ENGINEERING Microelectronics Reliability 36 11-12 SPEC. ISS. 1663-1666 MCRLA 2014-10-07T02:58:43Z 2014-10-07T02:58:43Z 1996-11 Article Lou, C.L.,Chim, W.K.,Chan, D.S.H.,Pan, Y. (1996-11). Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate. Microelectronics Reliability 36 (11-12 SPEC. ISS.) : 1663-1666. ScholarBank@NUS Repository. 00262714 http://scholarbank.nus.edu.sg/handle/10635/80546 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Microelectronics Reliability
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y.
format	Article
author	Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y.
spellingShingle	Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate
author_sort	Lou, C.L.
title	Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate
title_short	Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate
title_full	Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate
title_fullStr	Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate
title_full_unstemmed	Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate
title_sort	hot-carrier reliability of n- and p-channel mosfets with polysilicon and cvd tungsten-polycide gate
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/80546
_version_	1681088907771379712

Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate

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