Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance
10.1109/16.381990
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sg-nus-scholar.10635-807052024-11-09T07:32:47Z Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance Ling, C.H. Seah, B.P. Samudra, Ganesh S. Gan, Chock H. ELECTRICAL ENGINEERING 10.1109/16.381990 IEEE Transactions on Electron Devices 42 5 928-934 IETDA 2014-10-07T03:00:25Z 2014-10-07T03:00:25Z 1995-05 Article Ling, C.H., Seah, B.P., Samudra, Ganesh S., Gan, Chock H. (1995-05). Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance. IEEE Transactions on Electron Devices 42 (5) : 928-934. ScholarBank@NUS Repository. https://doi.org/10.1109/16.381990 00189383 http://scholarbank.nus.edu.sg/handle/10635/80705 A1995QU42700020 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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ScholarBank@NUS |
| description |
10.1109/16.381990 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ling, C.H. Seah, B.P. Samudra, Ganesh S. Gan, Chock H. |
| format |
Article |
| author |
Ling, C.H. Seah, B.P. Samudra, Ganesh S. Gan, Chock H. |
| spellingShingle |
Ling, C.H. Seah, B.P. Samudra, Ganesh S. Gan, Chock H. Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance |
| author_sort |
Ling, C.H. |
| title |
Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance |
| title_short |
Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance |
| title_full |
Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance |
| title_fullStr |
Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance |
| title_full_unstemmed |
Measurement and simulation of hot carrier degradation in PMOSFET by gate capacitance |
| title_sort |
measurement and simulation of hot carrier degradation in pmosfet by gate capacitance |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/80705 |
| _version_ |
1821219237187813376 |