Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy
10.1109/55.669738
Saved in:
Main Authors: | , , , , , |
---|---|
Other Authors: | |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80752 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-80752 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-807522023-10-29T20:26:24Z Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy Lim, E.H. Karunasiri, G. Chua, S.J. Wong, H. Pey, K.L. Lee, K.H. ELECTRICAL ENGINEERING 10.1109/55.669738 IEEE Electron Device Letters 19 5 171-173 EDLED 2014-10-07T03:00:55Z 2014-10-07T03:00:55Z 1998-05 Article Lim, E.H., Karunasiri, G., Chua, S.J., Wong, H., Pey, K.L., Lee, K.H. (1998-05). Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy. IEEE Electron Device Letters 19 (5) : 171-173. ScholarBank@NUS Repository. https://doi.org/10.1109/55.669738 07413106 http://scholarbank.nus.edu.sg/handle/10635/80752 000073176700009 Scopus |
institution |
National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
description |
10.1109/55.669738 |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING Lim, E.H. Karunasiri, G. Chua, S.J. Wong, H. Pey, K.L. Lee, K.H. |
format |
Article |
author |
Lim, E.H. Karunasiri, G. Chua, S.J. Wong, H. Pey, K.L. Lee, K.H. |
spellingShingle |
Lim, E.H. Karunasiri, G. Chua, S.J. Wong, H. Pey, K.L. Lee, K.H. Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy |
author_sort |
Lim, E.H. |
title |
Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy |
title_short |
Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy |
title_full |
Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy |
title_fullStr |
Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy |
title_full_unstemmed |
Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy |
title_sort |
monitoring of tisi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/80752 |
_version_ |
1781783938788753408 |