Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy

10.1109/55.669738

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Main Authors: Lim, E.H., Karunasiri, G., Chua, S.J., Wong, H., Pey, K.L., Lee, K.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80752
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-807522023-10-29T20:26:24Z Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy Lim, E.H. Karunasiri, G. Chua, S.J. Wong, H. Pey, K.L. Lee, K.H. ELECTRICAL ENGINEERING 10.1109/55.669738 IEEE Electron Device Letters 19 5 171-173 EDLED 2014-10-07T03:00:55Z 2014-10-07T03:00:55Z 1998-05 Article Lim, E.H., Karunasiri, G., Chua, S.J., Wong, H., Pey, K.L., Lee, K.H. (1998-05). Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy. IEEE Electron Device Letters 19 (5) : 171-173. ScholarBank@NUS Repository. https://doi.org/10.1109/55.669738 07413106 http://scholarbank.nus.edu.sg/handle/10635/80752 000073176700009 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/55.669738
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Lim, E.H.
Karunasiri, G.
Chua, S.J.
Wong, H.
Pey, K.L.
Lee, K.H.
format Article
author Lim, E.H.
Karunasiri, G.
Chua, S.J.
Wong, H.
Pey, K.L.
Lee, K.H.
spellingShingle Lim, E.H.
Karunasiri, G.
Chua, S.J.
Wong, H.
Pey, K.L.
Lee, K.H.
Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy
author_sort Lim, E.H.
title Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy
title_short Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy
title_full Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy
title_fullStr Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy
title_full_unstemmed Monitoring of TiSi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy
title_sort monitoring of tisi 2 formation on narrow polycrystalline silicon lines using raman spectroscopy
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/80752
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