New electron and hole traps in GaAsP alloy

International Journal of Electronics

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Bibliographic Details
Main Authors:	Teo, K.L., Li, M.F., Goo, C.H., Lau, W.S., Lim, Y.T.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80800
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-80800
record_format	dspace
spelling	sg-nus-scholar.10635-808002015-01-28T14:10:43Z New electron and hole traps in GaAsP alloy Teo, K.L. Li, M.F. Goo, C.H. Lau, W.S. Lim, Y.T. ELECTRICAL ENGINEERING International Journal of Electronics 83 1 29-35 IJELA 2014-10-07T03:01:26Z 2014-10-07T03:01:26Z 1997 Article Teo, K.L.,Li, M.F.,Goo, C.H.,Lau, W.S.,Lim, Y.T. (1997). New electron and hole traps in GaAsP alloy. International Journal of Electronics 83 (1) : 29-35. ScholarBank@NUS Repository. 00207217 http://scholarbank.nus.edu.sg/handle/10635/80800 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	International Journal of Electronics
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Teo, K.L. Li, M.F. Goo, C.H. Lau, W.S. Lim, Y.T.
format	Article
author	Teo, K.L. Li, M.F. Goo, C.H. Lau, W.S. Lim, Y.T.
spellingShingle	Teo, K.L. Li, M.F. Goo, C.H. Lau, W.S. Lim, Y.T. New electron and hole traps in GaAsP alloy
author_sort	Teo, K.L.
title	New electron and hole traps in GaAsP alloy
title_short	New electron and hole traps in GaAsP alloy
title_full	New electron and hole traps in GaAsP alloy
title_fullStr	New electron and hole traps in GaAsP alloy
title_full_unstemmed	New electron and hole traps in GaAsP alloy
title_sort	new electron and hole traps in gaasp alloy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/80800
_version_	1681088955055865856

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