New electron and hole traps in GaAsP alloy

New electron and hole traps in GaAsP alloy

International Journal of Electronics

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Bibliographic Details
Main Authors:	Teo, K.L., Li, M.F., Goo, C.H., Lau, W.S., Lim, Y.T.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80800
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Institution:	National University of Singapore

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