Characterization of MBE-grown Ga1-xAlxAs alloy films by Raman scattering

10.1002/(SICI)1096-9918(199908)28:13.0.CO;2-I

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Bibliographic Details
Main Authors: Hou, Y.T., Feng, Z.C., Li, M.F., Chua, S.J.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80321
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Institution: National University of Singapore