Characterization of MBE-grown Ga1-xAlxAs alloy films by Raman scattering
10.1002/(SICI)1096-9918(199908)28:13.0.CO;2-I
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Main Authors: | Hou, Y.T., Feng, Z.C., Li, M.F., Chua, S.J. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80321 |
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Institution: | National University of Singapore |
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