Studies of traps in AlGaN/GaN high electron mobility transistors on silicon

AlGaN/GaN-based high-electron-mobility transistors (HEMTs) are promising for high-voltage, high-frequency and high-power applications such as DC-DC convertors, cellular base stations, radar and wireless communication systems. The impressive intrinsic material parameters such as large bandgap, high s...

Full description

Saved in:
Bibliographic Details
Main Author: Anand Mulagumoottil Jesudas
Other Authors: Subramaniam Arulkumaran
Format: Theses and Dissertations
Language:English
Published: 2016
Subjects:
Online Access:https://hdl.handle.net/10356/69059
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English