Plasma-induced damage to n-type GaN

Plasma-induced damage to n-type GaN

Applied Physics Letters

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Bibliographic Details
Main Authors: Choi, H.W., Chua, S.J., Raman, A., Pan, J.S., Wee, A.T.S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80992
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Institution: National University of Singapore
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