Plasma-induced damage to n-type GaN

Plasma-induced damage to n-type GaN

Applied Physics Letters

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Bibliographic Details
Main Authors:	Choi, H.W., Chua, S.J., Raman, A., Pan, J.S., Wee, A.T.S.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80992
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Institution:	National University of Singapore

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