Raman characterization of germanium nanocrystals in amorphous silicon oxide films synthesized by rapid thermal annealing

Raman characterization of germanium nanocrystals in amorphous silicon oxide films synthesized by rapid thermal annealing

Journal of Applied Physics

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Bibliographic Details
Main Authors: Choi, W.K., Ng, V., Ng, S.P., Thio, H.H., Shen, Z.X., Li, W.S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81046
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Institution: National University of Singapore
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