REFRACTOMETRY THROUGH OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY.
Electronics Letters
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Main Authors: | Tjhung, T.T., Teo, S.K., Mendis, F.V.C., Selvan, B. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/81082 |
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Institution: | National University of Singapore |
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