Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique

Annual Proceedings - Reliability Physics (Symposium)

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Main Authors: Chin, J.M., Phang, J.C.H., Chan, D.S.H., Soh, C.E., Gilfeather, G.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81186
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-811862015-04-07T16:41:03Z Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique Chin, J.M. Phang, J.C.H. Chan, D.S.H. Soh, C.E. Gilfeather, G. ELECTRICAL ENGINEERING Annual Proceedings - Reliability Physics (Symposium) 420-424 ARLPB 2014-10-07T03:05:34Z 2014-10-07T03:05:34Z 2000 Article Chin, J.M.,Phang, J.C.H.,Chan, D.S.H.,Soh, C.E.,Gilfeather, G. (2000). Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique. Annual Proceedings - Reliability Physics (Symposium) : 420-424. ScholarBank@NUS Repository. 00999512 http://scholarbank.nus.edu.sg/handle/10635/81186 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Annual Proceedings - Reliability Physics (Symposium)
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Chin, J.M.
Phang, J.C.H.
Chan, D.S.H.
Soh, C.E.
Gilfeather, G.
format Article
author Chin, J.M.
Phang, J.C.H.
Chan, D.S.H.
Soh, C.E.
Gilfeather, G.
spellingShingle Chin, J.M.
Phang, J.C.H.
Chan, D.S.H.
Soh, C.E.
Gilfeather, G.
Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
author_sort Chin, J.M.
title Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_short Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_full Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_fullStr Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_full_unstemmed Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
title_sort single contact optical beam induced currents (scobic) - a new failure analysis technique
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/81186
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