Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique

Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique

Annual Proceedings - Reliability Physics (Symposium)

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Bibliographic Details
Main Authors:	Chin, J.M., Phang, J.C.H., Chan, D.S.H., Soh, C.E., Gilfeather, G.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81186
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Institution:	National University of Singapore

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