Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique

Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique

10.1109/PVSC.2011.6185850

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Bibliographic Details
Main Authors: Meng, L., Steen, S., Koo, C.K., Bhatia, C.S., Street, A.G., Joshi, P., Kim, Y.H., Phang, J.C.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69586
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/69586

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