Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique

10.1109/PVSC.2011.6185850

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Main Authors:	Meng, L., Steen, S., Koo, C.K., Bhatia, C.S., Street, A.G., Joshi, P., Kim, Y.H., Phang, J.C.H.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/69586
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-69586
record_format	dspace
spelling	sg-nus-scholar.10635-695862015-01-09T20:12:44Z Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique Meng, L. Steen, S. Koo, C.K. Bhatia, C.S. Street, A.G. Joshi, P. Kim, Y.H. Phang, J.C.H. ELECTRICAL & COMPUTER ENGINEERING 10.1109/PVSC.2011.6185850 Conference Record of the IEEE Photovoltaic Specialists Conference 000079-000084 CRCND 2014-06-19T03:02:21Z 2014-06-19T03:02:21Z 2011 Conference Paper Meng, L.,Steen, S.,Koo, C.K.,Bhatia, C.S.,Street, A.G.,Joshi, P.,Kim, Y.H.,Phang, J.C.H. (2011). Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique. Conference Record of the IEEE Photovoltaic Specialists Conference : 000079-000084. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/PVSC.2011.6185850" target="_blank">https://doi.org/10.1109/PVSC.2011.6185850</a> 9781424499656 01608371 http://scholarbank.nus.edu.sg/handle/10635/69586 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	10.1109/PVSC.2011.6185850
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Meng, L. Steen, S. Koo, C.K. Bhatia, C.S. Street, A.G. Joshi, P. Kim, Y.H. Phang, J.C.H.
format	Conference or Workshop Item
author	Meng, L. Steen, S. Koo, C.K. Bhatia, C.S. Street, A.G. Joshi, P. Kim, Y.H. Phang, J.C.H.
spellingShingle	Meng, L. Steen, S. Koo, C.K. Bhatia, C.S. Street, A.G. Joshi, P. Kim, Y.H. Phang, J.C.H. Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique
author_sort	Meng, L.
title	Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique
title_short	Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique
title_full	Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique
title_fullStr	Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique
title_full_unstemmed	Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique
title_sort	characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/69586
_version_	1681087040885620736

Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique

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