Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique

• Main Authors: Meng, L., Steen, S., Koo, C.K., Bhatia, C.S., Street, A.G., Joshi, P., Kim, Y.H., Phang, J.C.H.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/69586
• Institution: National University of Singapore

10.1109/PVSC.2011.6185850