Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique

Semiconductor Science and Technology

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Main Authors:	Teh, G.L., Chim, W.K., Swee, Y.K., Co, Y.K.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81210
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81210
record_format	dspace
spelling	sg-nus-scholar.10635-812102023-08-07T09:34:01Z Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique Teh, G.L. Chim, W.K. Swee, Y.K. Co, Y.K. ELECTRICAL ENGINEERING Semiconductor Science and Technology 12 6 662-671 SSTEE 2014-10-07T03:05:49Z 2014-10-07T03:05:49Z 1997-06 Article Teh, G.L., Chim, W.K., Swee, Y.K., Co, Y.K. (1997-06). Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique. Semiconductor Science and Technology 12 (6) : 662-671. ScholarBank@NUS Repository. 02681242 http://scholarbank.nus.edu.sg/handle/10635/81210 A1997XE15000002 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Semiconductor Science and Technology
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Teh, G.L. Chim, W.K. Swee, Y.K. Co, Y.K.
format	Article
author	Teh, G.L. Chim, W.K. Swee, Y.K. Co, Y.K.
spellingShingle	Teh, G.L. Chim, W.K. Swee, Y.K. Co, Y.K. Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique
author_sort	Teh, G.L.
title	Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique
title_short	Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique
title_full	Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique
title_fullStr	Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique
title_full_unstemmed	Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique
title_sort	spectroscopic photon emission measurements of n-channel mosfets biased into snapback breakdown using a continuous-pulsing transmission line technique
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81210
_version_	1776257941456814080

Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique

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