The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's

10.1109/16.753708

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Bibliographic Details
Main Authors:	Ang, D.S., Ling, C.H.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Subjects:	Electron traps Hot-electron injection Interface traps MOSFET's Post-stress effect Si-SiO2 interface
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81259
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81259
record_format	dspace
spelling	sg-nus-scholar.10635-812592024-11-14T22:46:54Z The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's Ang, D.S. Ling, C.H. ELECTRICAL ENGINEERING BACHELOR OF TECHNOLOGY PROGRAMME Electron traps Hot-electron injection Interface traps MOSFET's Post-stress effect Si-SiO2 interface 10.1109/16.753708 IEEE Transactions on Electron Devices 46 4 738-746 IETDA 2014-10-07T03:06:24Z 2014-10-07T03:06:24Z 1999 Article Ang, D.S., Ling, C.H. (1999). The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's. IEEE Transactions on Electron Devices 46 (4) : 738-746. ScholarBank@NUS Repository. https://doi.org/10.1109/16.753708 00189383 http://scholarbank.nus.edu.sg/handle/10635/81259 000079394700018 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Electron traps Hot-electron injection Interface traps MOSFET's Post-stress effect Si-SiO2 interface
spellingShingle	Electron traps Hot-electron injection Interface traps MOSFET's Post-stress effect Si-SiO2 interface Ang, D.S. Ling, C.H. The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's
description	10.1109/16.753708
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ang, D.S. Ling, C.H.
format	Article
author	Ang, D.S. Ling, C.H.
author_sort	Ang, D.S.
title	The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's
title_short	The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's
title_full	The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's
title_fullStr	The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's
title_full_unstemmed	The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's
title_sort	role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-mosfet's
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81259
_version_	1821204388508598272

The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's

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