X-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems
Journal of Applied Physics
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sg-nus-scholar.10635-813662015-01-07T04:37:20Z X-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems Choi, W.K. Poon, F.W. Loh, F.C. Tan, K.L. PHYSICS ELECTRICAL ENGINEERING Journal of Applied Physics 81 11 7386-7391 JAPIA 2014-10-07T03:07:31Z 2014-10-07T03:07:31Z 1997-06-01 Article Choi, W.K.,Poon, F.W.,Loh, F.C.,Tan, K.L. (1997-06-01). X-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems. Journal of Applied Physics 81 (11) : 7386-7391. ScholarBank@NUS Repository. 00218979 http://scholarbank.nus.edu.sg/handle/10635/81366 NOT_IN_WOS Scopus |
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PHYSICS Choi, W.K. Poon, F.W. Loh, F.C. Tan, K.L. |
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Choi, W.K. Poon, F.W. Loh, F.C. Tan, K.L. |
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Choi, W.K. Poon, F.W. Loh, F.C. Tan, K.L. X-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems |
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Choi, W.K. |
title |
X-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems |
title_short |
X-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems |
title_full |
X-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems |
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X-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems |
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X-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems |
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x-ray photoelectron spectroscopy study of rapid thermal annealed silicon-silicon oxide systems |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/81366 |
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